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With the rapid development and innovative applications of new III-V semiconductor materials, how to easily achieve ultra-fast characterization of gallium nitride (GaN), gallium arsenide (GaAs) and other compound semiconductors like DC measurement I-V source and measure operation? How can I prevent device self-heating by using narrow pulses and/or low duty cycle pulses instead of DC signals? How to meet the application requirements that require both ultra-fast voltage output and simultaneous high-sensitivity current measurement?
The answer given by Precise Instruments' upcoming ns-level semiconductor high-speed device I-V test solution is: fully satisfied!
Plug-in card design + 1CH/plug-in card + up to 10 channels, the new generation of pulse constant voltage source CP5xx series of Precise instruments will be announced for you soon!
What kind of configuration can make the test more accurate and efficient. Narrow pulse width, high precision, wide range plug-in card type pulse constant voltage source, the new generation pulse constant voltage source CP5xx series of Proces Instruments will be announced for you soon!
A new generation of semiconductor high-speed device I-V testing, performance characterization of high-power lasers, GaN RF power amplifiers, and memristors. The new generation of pulse constant voltage source CP5xx series will be announced for you soon!
Innovative new products, endless research! Coming soon, stay tuned!