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development history

Focus on semiconductor electrical performance testing

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2016

source：admin time：2022-11-07 14:24 Views：342

Launched burst error rate test system, 100G error rate test system, EML device coupling and test system, positioning return loss test system, BOB system card box combination test scheme, BOSA device automatic installation wave plate system, portable engineering equipment maintenance test system, etc

Previous： 2015
Next： 2017

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