development history development history

development history

Focus on semiconductor electrical performance testing

2020

source:admin time:2022-11-11 09:43 Views:364

Launched detector component testing and sorting machine, CHIP testing machine, EML aerial survey, LD high-temperature disk test, wavelength meter; launched "high-precision plug-in source measure meter", "high-precision desktop pulse source measure unit", "narrow pulse current source surface"

Previous: 2019
Next: 2021

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